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Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy

Software is usually available to calibrate the EDS system, and one should consult the system manual for the details of operation.

The larger the active area of the detector, the more counts will be collected, but at the expense of spectral resolution. A number in parentheses indicates the year of last reapproval. It is not intended to substitute for a formal course of instruction, but rather to provide a guide to the capabilities and limitations e15008 the technique asstm to its use.

For many metals containing medium atomic number elements, 20 to 30 kV is a good choice. An overvoltage that is too low will not sufficiently excite X rays; one that is too high yields low spatial resolution and causes absorption as X rays escape from deep within the specimen.

Whichever method is used, all elements present must be speci? The two elements need not be in the same specimen. Originally approved in Carbon that appears to be tan in color on the specimen surface, or on a piece of? Link to Active This link will always route to the current Active version of the standard.

ASTM–E 用能谱色散谱实施定量分析的指南_百度文库

Some software also allows the operator to? An approximation of 4 Johnson, G. On the MA alloy, the reproducibility among laboratories was much less than that of the standards technique R in Table 4. If the specimen is inhomogeneous at e508 micrometre level, then a truly quantitative analysis is not possible, and a bulk technique such as X-ray?


This is because a correction is necessary to account for the effect of other elements the matrix present in the specimen. When analyzing hard and soft X rays in the same specimen, analyses at two voltages may be necessary. Precision and Bias This method is not based on any model and, therefore, is more general.

If the specimen is tilted such that the beam is not perpendicular to the specimen surface, an effective take-off angle is used. A second round-robin test program, which required the use of a standard accelerating voltage, detector dead time, take-off angle, and acquisition time, was also initiated.

The occurrence of these two conditions together resulted in considerably lower precision than for the other elements. If the voltage measured in this manner is much lower than the voltage setting, it may be an indication that the specimen is charging.

Heavy elements those of higher atomic number may be analyzed using L or M lines, and so higher voltages are not necessary. The operator must also be aware of the possibility of spurious X rays from parts of the chamber, polishing compound elements, or from adjacent phases or a combination thereof.

Each participant was requested to analyze?

ASTM E – 12a – Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy

It is also useful for the light element region of the spectrum where the models were never intended to be used; however, it does not take into 6 Fiori, C. Sr SR Nickel 9.


Both specimens were analyzed by various metal producers, EDS system manufacturers, and one university. Often aluminum and copper are used, and sometimes both the K and L lines of copper are used.

Concentrations are normally reported to a tenth of a percent; although many computer programs report more signi? Observing the high-energy cutoff of the continuum, as noted in 8. For quantitative analysis using standards, the beam current not specimen current must be the same for both the specimen and the standards or one must be normalized to the other. The count rate incident on an X-ray detector is directly proportional to the size of the solid angle de?

It is not intended to substitute for a formal course of instruction, but rather to provide a guide to the capabilities and limitations of the technique and to its use.

As such, the precision obtained should be representative of the technique. The compositions of both alloys, as determined by wet chemical analysis, are given in Table 2. Although results of the standardless analyses were rather good on the Type stainless steel, they may be considerably inferior on other types of specimens.

If the stoichiometry of compounds containing light elements astj known, then calculation by stoichiometry is the most accurate method. The minimum detectability limit of light elements is also degraded because of the lower peak-to-background ratios found with soft X rays.